polished section analysis

The series production of cable loops particularly in the automotive industry has to meet and to prove highest quality standards. A micrograph examination can reveal quality defects caused by wear,  by differences in temperature and particularly by  tool changes or material variations and avoid rejections or claims.

A constant control of the crimping quality is our target. The measurement of the crimping height and the counting of strand centers belong to our standard. Polished micrograph sections are prepared and documented on request according to specified concepts during continuous operations. They are also a valuable support in regard to the fitting and servicing of crimping tools.

We also offer a supplementary examination of the crimp contacts to cover the crimping zone by the polished micrograph section analysis in the range of 0.05 mm² til 16 mm² e.g. from external parts before launching or to evaluate cables being already operated in the field. Please contact us. We would be pleased to advise you.

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polished section analysis

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Portrait von Marius Lemm
  • Marius Lemm

polished section analysis

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